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SPIE Proceedings [SPIE Optics & Photonics - San Diego, CA (Sunday 13 August 2006)] Mathematics of Data/Image Pattern Recognition, Compression, and Encryption with Applications IX - Automatic inspection of small component on loaded PCB based on SVD and SVM
Wang, Yan, Sun, Yi, Liu, Minghe, Lv, Peng, Wu, Tianjing, Ritter, Gerhard X., Schmalz, Mark S., Barrera, Junior, Astola, Jaakko T.Volume:
6315
Year:
2006
Language:
english
DOI:
10.1117/12.678927
File:
PDF, 345 KB
english, 2006