Evaluation of fabrication process and barrier structure for interface-modified ramp-edge junctions
Yoshihiro Ishimaru, Yuan Wu, Osami Horibe, Hiroyoshi Tano, Toshiaki Suzuki, Yuichi Yoshida, Masahiro Horibe, Hironori Wakana, Seiji Adachi, Yoshihiro Takahashi, Yasuo Oshikubo, Hideyuki Sugiyama, MichVolume:
378-381
Year:
2002
Language:
english
Pages:
7
DOI:
10.1016/s0921-4534(02)01708-2
File:
PDF, 388 KB
english, 2002