Relation between barrier structure and electrical...

Physica C: Superconductivity 2003 Vol. 392-396; Iss. part-P2

Relation between barrier structure and electrical properties of interface-modified ramp-edge junctions

Yoshihiro Ishimaru, Yuan Wu, Toshiaki Suzuki, Masahiro Horibe, Osami Horibe, Hironori Wakana, Seiji Adachi, Yoshinobu Tarutani, Keiichi Tanabe
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Volume:
392-396
Year:
2003
Language:
english
Pages:
5
DOI:
10.1016/s0921-4534(03)01030-x
File:
PDF, 309 KB
english, 2003
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