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Real-time Hall effect measurements of high critical currents epitaxial YBa2Cu3O7−x thin films
S.G. Zybtsev, V.I. Nizhankovskii, S.F. KimVolume:
282-287
Year:
1997
Language:
english
Pages:
2
DOI:
10.1016/s0921-4534(97)00771-5
File:
PDF, 141 KB
english, 1997