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Measurement system for accurate characterization of microwave surface resistance of high-Tc superconductors thin films
Zheng-xiang Luo, Kai Yang, Jian Lu, Zhong-xi Tang, Qi-shao ZhangVolume:
282-287
Year:
1997
Language:
english
Pages:
2
DOI:
10.1016/s0921-4534(97)01345-2
File:
PDF, 175 KB
english, 1997