Evolution and analysis of nitride surface and interfaces by statistical techniques: A correlation with RHEED through kinetic roughening
Bag, Ankush, Kumar, Rahul, Mukhopadhyay, Partha, Mahata, Mihir K., Chakraborty, Apurba, Ghosh, Saptarsi, Jana, Sanjay K., Biswas, DhrubesVolume:
11
Language:
english
Journal:
Electronic Materials Letters
DOI:
10.1007/s13391-015-5129-3
Date:
July, 2015
File:
PDF, 2.24 MB
english, 2015