[IEEE 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Pisa, Italy (2015.5.11-2015.5.14)] 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings - An automatic voltage disturbance classification system based on Clonal Selection Algorithm
de Souza Arruda, Bruno Willian, Freire, Raimundo Carlos Silverio, de Souza, Cleonilson ProtasioYear:
2015
Language:
english
DOI:
10.1109/I2MTC.2015.7151251
File:
PDF, 1.19 MB
english, 2015