Interface structure studies by atomic resolution electron...

Interface structure studies by atomic resolution electron microscopy, order–disorder phenomena and atomic diffusion in gas-phase synthesized nanocrystalline solids

H.-E Schaefer, K Reimann, W Straub, F Phillipp, H Tanimoto, U Brossmann, R Würschum
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Volume:
286
Year:
2000
Language:
english
Pages:
10
DOI:
10.1016/s0921-5093(00)00659-6
File:
PDF, 1.49 MB
english, 2000
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