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Residual stresses in thermal barrier coatings: effects of interface asperity curvature/height and oxide thickness
Chun-Hway Hsueh, Edwin R Fuller Jr.Volume:
283
Year:
2000
Language:
english
Pages:
10
DOI:
10.1016/s0921-5093(00)00743-7
File:
PDF, 1.42 MB
english, 2000