Characterization of native oxide layers on amorphous...

Characterization of native oxide layers on amorphous Fe73.5Si15.5B7Cu1Nb3 before and after high-energy heavy ion irradiation by X-ray photoelectron spectroscopy (XPS)

Rohit Jain, N.S. Saxena, K.V.R. Rao, D.K. Avasthi, K. Asokan, S.K. Sharma
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Volume:
297
Year:
2001
Language:
english
Pages:
6
DOI:
10.1016/s0921-5093(00)01262-4
File:
PDF, 106 KB
english, 2001
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