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Critical epitaxial film thickness for forming interface dislocations
Sanboh Lee, Shing-Dar Wang, Chun-Hway HsuehVolume:
309-310
Year:
2001
Language:
english
Pages:
5
DOI:
10.1016/s0921-5093(00)01717-2
File:
PDF, 107 KB
english, 2001