Investigation of white etching layers on rails by optical...

Materials Science and Engineering: A 2001 Vol. 303; Iss. 1-2

Investigation of white etching layers on rails by optical microscopy, electron microscopy, X-ray and synchrotron X-ray diffraction

W. Österle, H. Rooch, A. Pyzalla, L. Wang
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Volume:
303
Year:
2001
Language:
english
Pages:
8
DOI:
10.1016/s0921-5093(00)01842-6
File:
PDF, 669 KB
english, 2001
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