Characterization of thermally activated dislocation mechanisms using transient tests
J.L. Martin, B. Lo Piccolo, T. Kruml, J. BonnevilleVolume:
322
Year:
2002
Language:
english
Pages:
8
DOI:
10.1016/s0921-5093(01)01124-8
File:
PDF, 182 KB
english, 2002