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Cryo-transfer TEM study of vacancy cluster formation in thin films of aluminum and copper elongated at low temperature
Ichiro Mukouda, Yoshiharu Shimomura, Michio KiritaniVolume:
350
Year:
2003
Language:
english
Pages:
7
DOI:
10.1016/s0921-5093(02)00704-9
File:
PDF, 803 KB
english, 2003