Using atomic force microscopy to evaluate the development...

Using atomic force microscopy to evaluate the development of mesoscopic shear planes in materials processed by severe plastic deformation

Yi Huang, Terence G. Langdon
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Volume:
358
Year:
2003
Language:
english
Pages:
8
DOI:
10.1016/s0921-5093(03)00268-5
File:
PDF, 410 KB
english, 2003
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