Corrosion-Based Failure of Oxide-Aperture VCSELs

IEEE Journal of Quantum Electronics 2013 / 12 Vol. 49; Iss. 12

Corrosion-Based Failure of Oxide-Aperture VCSELs

Herrick, Robert W., Dafinca, Alexandru, Farthouat, Philippe, Grillo, Alexander A., McMahon, Stephen J., Weidberg, Anthony R.
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Volume:
49
Language:
english
Journal:
IEEE Journal of Quantum Electronics
DOI:
10.1109/JQE.2013.2285572
Date:
December, 2013
File:
PDF, 4.89 MB
english, 2013
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