SPIE Proceedings [SPIE SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 9 July 1995)] X-Ray and Extreme Ultraviolet Optics - Measurements and calculations of flat and spherically bent mica crystals' reflectivity and using them for different applications in the spectral range 1-19 Å

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