In-situ strain measurements in the Ni/NiO system during high temperature oxidation
John G. Goedjen, David A. Shores, James H. StoutVolume:
222
Year:
1997
Language:
english
Pages:
12
DOI:
10.1016/s0921-5093(96)10500-1
File:
PDF, 1.32 MB
english, 1997