Breakdown of Shape Memory Effect in Bent Cu–Al–Ni Nanopillars: When Twin Boundaries Become Stacking Faults
Liu, Lifeng, Ding, Xiangdong, Sun, Jun, Li, Suzhi, Salje, Ekhard K. H.Language:
english
Journal:
Nano Letters
DOI:
10.1021/acs.nanolett.5b03483
Date:
December, 2015
File:
PDF, 2.61 MB
english, 2015