[IEEE 2015 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) - Boston, MA, USA (2015.6.7-2015.6.12)] 2015 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) - Evaluation of output embeddings for fine-grained image classification
Akata, Zeynep, Reed, Scott, Walter, Daniel, Honglak Lee,, Schiele, BerntYear:
2015
Language:
english
DOI:
10.1109/CVPR.2015.7298911
File:
PDF, 484 KB
english, 2015