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A comparison of nucleation and growth investigations of thin films using scanning tunneling microscopy, atomic force microscopy and X-ray scattering
C.V. Dharmadhikari, A.O. Ali, N. Suresh, D.M. Phase, S.M. Chaudhari, A. Gupta, B.A. DasannacharyaVolume:
75
Year:
2000
Language:
english
Pages:
9
DOI:
10.1016/s0921-5107(00)00385-8
File:
PDF, 712 KB
english, 2000