Direct method to determine the elements of dielectric...

Direct method to determine the elements of dielectric tensor of perpendicular magnetic films by measuring the Kerr rotation angle θk and the reflectivity R of double-layered films

Xiong Rui, Li Zuoyi, Yang Xiaofei, Peng Zilong, Wang Ke, Tian Deichen
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Volume:
76
Year:
2000
Language:
english
Pages:
3
DOI:
10.1016/s0921-5107(00)00398-6
File:
PDF, 82 KB
english, 2000
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