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Direct method to determine the elements of dielectric tensor of perpendicular magnetic films by measuring the Kerr rotation angle θk and the reflectivity R of double-layered films
Xiong Rui, Li Zuoyi, Yang Xiaofei, Peng Zilong, Wang Ke, Tian DeichenVolume:
76
Year:
2000
Language:
english
Pages:
3
DOI:
10.1016/s0921-5107(00)00398-6
File:
PDF, 82 KB
english, 2000