High resolution X-ray diffraction using a high brilliance source, with rapid data analysis by auto-fitting
Mark Taylor, John Wall, Neil Loxley, Matthew Wormington, Tamzin LaffordVolume:
80
Year:
2001
Language:
english
Pages:
4
DOI:
10.1016/s0921-5107(00)00621-8
File:
PDF, 235 KB
english, 2001