Electron induced dissociation of hydrogen or deuterium–silicon complexes in GaAs; application to the reliability of GaAs based electronic or optoelectronic devices
S. Silvestre, D. Bernard, S. Mezière, E. ConstantVolume:
80
Year:
2001
Language:
english
Pages:
4
DOI:
10.1016/s0921-5107(00)00653-x
File:
PDF, 246 KB
english, 2001