Non-invasive electrical characterization of semiconductor...

Materials Science and Engineering: B 2003 Vol. 102; Iss. 1-3

Non-invasive electrical characterization of semiconductor interfaces

Regis Vanderhaghen, Samir Kasouit, João Pedro Conde, Hyun Mo Cho, Virginia Chu, Yun Woo Lee, Hyun Jong Kim, Sang Youl Kim, Jean Paul Kleider
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Volume:
102
Year:
2003
Language:
english
Pages:
5
DOI:
10.1016/s0921-5107(02)00638-4
File:
PDF, 425 KB
english, 2003
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