![](/img/cover-not-exists.png)
Time-resolved ion beam-induced charge collection measurement of minority carrier lifetime in semiconductor power devices by using Gunn's theorem
C. Manfredotti, F. Fizzotti, A. Lo Giudice, M. Jaksic, Z. Pastuovic, C. Paolini, P. Olivero, E. VittoneVolume:
102
Year:
2003
Language:
english
Pages:
5
DOI:
10.1016/s0921-5107(02)00656-6
File:
PDF, 237 KB
english, 2003