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Structural and electrical characterization of epitaxial 4H–SiC layers for power electronic device applications
L. Scaltrito, S. Porro, M. Cocuzza, F. Giorgis, C.F. Pirri, P. Mandracci, C. Ricciardi, S. Ferrero, C. Sgorlon, G. Richieri, L. Merlin, A. Castaldini, A. Cavallini, L. PolentaVolume:
102
Year:
2003
Language:
english
Pages:
6
DOI:
10.1016/s0921-5107(02)00726-2
File:
PDF, 360 KB
english, 2003