Absorption coefficient of oxide precipitates in silicon wafers after different three-step annealing
A. Sassella, A. Borghesi, P. Geranzani, M. Olmo, M. PorriniVolume:
102
Year:
2003
Language:
english
Pages:
4
DOI:
10.1016/s0921-5107(02)00740-7
File:
PDF, 178 KB
english, 2003