Microstructure and transport behavior of grain boundaries in YBa2Cu3Oy: A comparison between thin films and bulk bicrystals
D.J. Miller, V.R. Todt, M.St. Louis-Weber, X.F. Zhang, D.G. Steel, M.B. Field, K.E. GrayVolume:
53
Year:
1998
Language:
english
Pages:
7
DOI:
10.1016/s0921-5107(97)00314-0
File:
PDF, 895 KB
english, 1998