The photoelastic constant and internal stress around...

Materials Science and Engineering: B 1999 Vol. 57; Iss. 2

The photoelastic constant and internal stress around micropipe defects of 6H-SiC single crystal

Tomohisa Kato, Hitoshi Ohsato, Atsuto Okamoto, Naohiro Sugiyama, Takashi Okuda
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
57
Year:
1999
Language:
english
Pages:
3
DOI:
10.1016/s0921-5107(98)00317-1
File:
PDF, 132 KB
english, 1999
Conversion to is in progress
Conversion to is failed