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Incipient Fault Diagnostics and Remaining Useful Life Prediction of Analog Filters
Hu, Zewen, Xiao, Mingqing, Zhang, Lei, Song, Haifang, Yang, ZhaoVolume:
31
Language:
english
Journal:
Journal of Electronic Testing
DOI:
10.1007/s10836-015-5543-3
Date:
December, 2015
File:
PDF, 1.21 MB
english, 2015