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Surface photovoltage characterizations of Si nanopillar arrays for verifying field-effect passivation using a SiNx layer
Kim, Eunah, Cho, Yunae, Sohn, Ahrum, Kim, Dong-Wook, Park, Hyeong-Ho, Kim, JoondongVolume:
16
Language:
english
Journal:
Current Applied Physics
DOI:
10.1016/j.cap.2015.11.006
Date:
February, 2016
File:
PDF, 1.33 MB
english, 2016