Characterization of Co/Cu multilayers growth by scanning...

Surface Science 2002 / 6 Vol. 507-510

Characterization of Co/Cu multilayers growth by scanning probe microscopy

Marszałek, M., Jaworski, J., Lekki, J., Marszałek, K., Stachura, Z., Voznyi, V., Bölling, O., Sulkio-Cleff, B.
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Volume:
507-510
Language:
english
Journal:
Surface Science
DOI:
10.1016/s0039-6028(02)01269-4
Date:
June, 2002
File:
PDF, 246 KB
english, 2002
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