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Computer simulation of electric field variations due to movements of electric charges
Inoue, M., Suzuki, S., Akase, Z., Shindo, D.Volume:
61
Language:
english
Journal:
Journal of Electron Microscopy
DOI:
10.1093/jmicro/dfs046
Date:
August, 2012
File:
PDF, 320 KB
english, 2012