A new grating X-ray spectrometer for 2-4 keV enabling a...

Microscopy 2013 / 06 Vol. 62; Iss. 3

A new grating X-ray spectrometer for 2-4 keV enabling a separate observation of In-L  and Sn-L  emissions of indium tin oxide

Terauchi, M., Takahashi, H., Handa, N., Murano, T., Koike, M., Kawachi, T., Imazono, T., Hasegawa, N., Koeda, M., Nagano, T., Sasai, H., Oue, Y., Yonezawa, Z., Kuramoto, S.
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Volume:
62
Language:
english
Journal:
Microscopy
DOI:
10.1093/jmicro/dfs129
Date:
June, 2013
File:
PDF, 257 KB
english, 2013
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