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[IEEE 2015 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP) - Suzhou, China (2015.7.1-2015.7.3)] 2015 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP) - Analysis of trapping effect in GaN HEMT modeling
Qian, Weiqiang, Khan, Mehdi, Huang, Dong, Lin, FujiangYear:
2015
Language:
english
DOI:
10.1109/imws-amp.2015.7324919
File:
PDF, 523 KB
english, 2015