Quality-of-Service Implications of Enhanced Program...

IEEE Transactions on Device and Materials Reliability 2015 / 9 Vol. 15; Iss. 3

Quality-of-Service Implications of Enhanced Program Algorithms for Charge-Trapping NAND in Future Solid-State Drives

Grossi, Alessandro, Zuolo, Lorenzo, Restuccia, Francesco, Zambelli, Cristian, Olivo, Piero
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Volume:
15
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2015.2448108
Date:
September, 2015
File:
PDF, 1.62 MB
english, 2015
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