Pattern Dependence of TMR Sensor Noise
Venugopal, Veerakumar, Wu, Guoguang, Stokes, Scott, Yin, HuaqingVolume:
51
Language:
english
Journal:
IEEE Transactions on Magnetics
DOI:
10.1109/tmag.2015.2444277
Date:
November, 2015
File:
PDF, 1.11 MB
english, 2015