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Extended depth-of-field imaging through radially symmetrical conjugate phase masks
Chen, Shouqian, Le, Van Nhu, Fan, Zhigang, Tran, Hong CamVolume:
54
Language:
english
Journal:
Optical Engineering
DOI:
10.1117/1.oe.54.11.115103
Date:
November, 2015
File:
PDF, 2.16 MB
english, 2015