SPIE Proceedings [SPIE Electronic Imaging 2004 - San Jose, CA (Sunday 18 January 2004)] Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications V - A new sensor alignment method for an 8k x 4k-pixel ultrahigh definition camera with four imagers
Yamashita, Takayuki, Mitani, Kohji, Shimamoto, Hiroshi, Shirakawa, Miho, Okano, Fumio, Blouke, Morley M., Sampat, Nitin, Motta, Ricardo J.Volume:
5301
Year:
2004
Language:
english
DOI:
10.1117/12.526609
File:
PDF, 1.62 MB
english, 2004