SPIE Proceedings [SPIE Optics East 2006 - Boston, MA (Sunday 1 October 2006)] Optoelectronic Devices: Physics, Fabrication, and Application III - Improvement of SLD efficiency by focused ion beam post-fabrication processing
Causa, F., Milani, M., Sarma, J., Tatti, F., Ferraro, L., Piprek, Joachim, Wang, Jian JimVolume:
6368
Year:
2006
Language:
english
DOI:
10.1117/12.685984
File:
PDF, 931 KB
english, 2006