SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, CA (Sunday 2 August 2009)] Advances in X-Ray/EUV Optics and Components IV - Absolute efficiency measurement of high-performance zone plates
Chen, Sharon, Lyon, Alan, Kirz, Janos, Seshadri, Srivatsan, Feng, Yan, Feser, Michael, Sassolini, Simone, Duewer, Fred, Zeng, Xianghui, Huang, Carson, Khounsary, Ali M., Morawe, Christian, Goto, ShunjVolume:
7448
Year:
2009
Language:
english
DOI:
10.1117/12.825367
File:
PDF, 1.56 MB
english, 2009