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SPIE Proceedings [SPIE 1983 International Techincal Conference/Europe - Geneva, Switzerland (Monday 18 April 1983)] Thin Film Technologies I - Interpretation Of Wide Band Scans Of Growing Optical Thin Films In Terms Of Layer Microstructure
Flory, F., Schmitt, B., Pelletier, E., Macleod, H. A., Jacobsson, J. RolandVolume:
401
Year:
1983
Language:
english
DOI:
10.1117/12.935509
File:
PDF, 287 KB
english, 1983