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Quasi-static bending test of nano-scale SiO2 wire at intermediate temperatures using AFM-based technique
Takahiro Namazu, Yoshitada IsonoVolume:
104
Year:
2003
Language:
english
Pages:
8
DOI:
10.1016/s0924-4247(02)00431-4
File:
PDF, 533 KB
english, 2003