CMOS temperature sensors and built-in test circuitry for thermal testing of ICs
V. Székely, M. Rencz, S. Török, Cs. Márta, L. Lipták-FegóVolume:
71
Year:
1998
Language:
english
Pages:
9
DOI:
10.1016/s0924-4247(98)00165-4
File:
PDF, 935 KB
english, 1998