Thin film thickness sensor based on a new magnetostrictive delay line arrangement
E. Hristoforou, H. Chiriac, J.N. AvaritsiotisVolume:
76
Year:
1999
Language:
english
Pages:
6
DOI:
10.1016/s0924-4247(98)00376-8
File:
PDF, 347 KB
english, 1999