Film thickness measurement and linear dichroism of organic thin films prepared by molecular beam deposition at oblique incidence
Bert Müller, Matthias Jäger, Ye Tao, Armin Kündig, Chengzhi Cai, Christian Bosshard, Peter GünterVolume:
12
Year:
1999
Language:
english
Pages:
6
DOI:
10.1016/s0925-3467(99)00065-8
File:
PDF, 206 KB
english, 1999