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An exchangeable Si wafer internal reflection element for FT-IR measurement of water sample
Michiko Seyama, Iwao Sugimoto, Tadashi KatohVolume:
74
Year:
2001
Language:
english
Pages:
6
DOI:
10.1016/s0925-4005(00)00711-5
File:
PDF, 397 KB
english, 2001