![](/img/cover-not-exists.png)
A Bayesian approach to prediction of system failure rates by criticalities under event trees
Chi-Hyuck Jun, Soo Y. Chang, Yushin Hong, Heejoong YangVolume:
60-61
Year:
1999
Language:
english
Pages:
6
DOI:
10.1016/s0925-5273(98)00135-2
File:
PDF, 122 KB
english, 1999