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SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - San Francisco, California, United States (Sunday 8 February 2015)] Three-Dimensional Image Processing, Measurement (3DIPM), and Applications 2015 - A no-reference stereoscopic quality metric
Sitnik, Robert, Puech, William, Silva, Alessandro R., Vizcarra Melgar, Max E., Farias, Mylène C. Q.Volume:
9393
Year:
2015
Language:
english
DOI:
10.1117/12.2083306
File:
PDF, 342 KB
english, 2015